Microwave Materials Permittivity and Permeability Measurement Methods
Keywords:
permittivity, permeability, microwave frequency, measurement methods
Abstract
Methods for measuring the microwave permittivity and permeability of materials are considered. The specific features and applicability conditions of measurement methods in transmission lines and in free space are shown, and the measurement errors are analyzed along with the calibration procedures applied for reducing the errors. Individual sections of the articles contain descriptions of scalar, resonance, quasistatic, and quasioptic methods. It has been determined that out of many existing techniques, the NicolsonRossWeir measurement method in a coaxial line and also the method for measuring the permeability of thin ferromagnetic films with the use of a shortcircuited strip cell are most widely applied. By using these methods, the majority of matters concerned with studying the microwave properties of materials can be solved.
References
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#
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51. BelhadjTakar N.E., FourierLamer A. J. Electromagn. Waves Appl., 1992, vol. 16, 1225 p.
52. Bottreau A.M., Merzouki A. IEEE Trans. Instrum. Meas., 1993, vol. 42, 899 p.
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71. Djerfaf F., Vincent D., Robert S., Merzouki A. Eur. Phys. J. Appl. Phys., 2011, vol. 56. Art. No. 30601.
72. Wu Y.Q., Tang Z.X., Xu Y.H., et al. IEEE Trans. Magn., 2010, vol. 46, 886 p.
73. Chai G.Z., Yang Y.C., Zhu J.G., et al. Appl. Phys. Lett., 2010, vol. 96, Art. No. 012505.
74. Wang P.S., Zhang H.Q., Divan R., Hoffmann A. IEEE Trans. Magn., 2009, vol. 45, 71 p.
75. Sebastian T., Clavijo S.A., Diaz R.E. J. Appl. Phys., 2013, vol. 113, Art. No. 033906.
76. Yousefi L., Attia H., Ramahi O.M. PIER, 2009, vol. 90, 1 p.
77. Heuermann H., Schiek B. IEEE Trans. Microw. Theor. Techn., 1997, vol. 45, 408 p.
78. Starostenko S.N., Rozanov K.N. Radiotekhnika i elektronika, 2013, vol. 58, No. 11, 1113 p.
79. Queffelec P., Le Floc’h M., Gelin P. IEEE Trans. Instr. Meas., 1998, vol. 47, 956 p.
80. Ding Y., Klemmer T.J., Crawford T.M. J. Appl. Phys., 2004, vol. 96, 2969 p.
81. Fessant A., Gerialtovski J., Loaec J., et al. J. Magn. Magn. Mater., 1994, vol. 133, 413 p.
82. Fessant A., Gieraltowski J., Loaec J., et al. IEEE Trans. Magn., 1993, vol. 29, 82 p.
83. Pain D., Ledieu M., Acher O., et al. J. Appl. Phys., 1999, vol. 85, 5151 p.
84. Yoshida S., Ono H., Ando S., et al. IEEE Trans Magn., 2001, vol. 37, 2401 p.
85. Acher O., Jacquart P.M., Fontaine J.M., et al. IEEE Trans. Magn., 1994, vol. 30, 4533 p.
86. Acher O., Le Gourrierec P., Perrin G., et al. IEEE Trans. Microw. Theor. Techn., 1996, vol. 44, 674 p.
87. Lagarkov A.N., Kashurkin O. Yu., Maklakov S.А., et al. Radiotekhnika i elektronika, 2012, No. 4, 441 p.
88. Iakubov I.T., Lagarkov A.N., Maklakov S.А., et al. J. Magn. Magn. Mater., 2009, vol. 321, 726 p.
89. Liu Z.W., Liu Y., Yan L., et al. J. Appl. Phys., 2006, vol. 99, Art. No. 043903.
90. Zhang L., Zhu Z.W., Kuang R.X., et al. J. Inorganic Mater., 2010, vol. 25, 1150 p.
91. Afsar M.N., Birch J.R., Clarke R.N. Proc. IEEE, 1986,. vol 74, 183 p.
92. Ghodgaonkar D.K., Varadan V.V., Varadan V.K. IEEE Trans. Instrum. Meas., 1989, vol. 37, 789 p.
93. Liu L., Matitsine S.M., Gan Y.B., Rozanov K.N. J. Appl. Phys., 2005, vol. 98, Art. No. 063512.
94. Lagarkov A.N., Matytsin S.M., Rozanov K.N., Sarychev A.K. J. Appl. Phys., 1998, vol. 84, 3806 p.
95. Hock K.M. IEEE Trans. Microw. Theory Techn., 2006, vol. 54, 648 p.
96. Li J.G., Huang J.J., Qin Y., Ma F. Mat. Sci. Eng. B, 2007, vol. 138, 199 p.
97. Makhnovskiy D.P., Panina L.V., Garcia C., et al. Phys. Rev. B, 2006, vol. 74, Art. No. 064205.
98. Hollinger R.D., Jose K.A., Tellakula A., et al. Microw. Opt. Technol. Lett., 2000, vol. 26, 100 p.
99. Korolev K.A., Chen S., Afsar M.N. IEEE Trans. Magn., 2008, vol. 44, 435 p.
100. Lagarkov A.N., Semenenko V.N., Chistyaev V.A., Iakubov I.T. J. Magn. Magn. Mater., 2012, vol. 324, 3402 p.
101. Zivkovic I., Murk A. J. Appl. Phys., 2012, vol. 111, Art. No. 114104.
2. BakerJarvis J., Janezic M.D., Riddle B.F. NIST Tech. Note 1536. Boulder, USA, 2004, 157 p.
3. BakerJarvis J., Janezic M.D., Grosvenor J.H., Geyer R.G. NIST Tech. Note 1355 R. Boulder, USA, 1993, 118 p.
4. BakerJarvis J., Janezic M.D., Riddle B., et al. NIST Tech. Note 1520. Boulder, USA, 2001,157 p.
5. Fenner R.A., Rothwell E.J., Frasch L.L. Radio Sci., 2012, vol. 47, RS1004 p.
6. Francsechetti G.G. Alta Freq, 1967, vol. 36, 757 p.
7. Misra D.K. In: Measurement, Instrumentation, and Sensors Handbook, CRC Press. — IEEE Press, 2000, Ch. 46, pp. 461–46 12.
8. Musil J., Zasek F. Microwave Measurements of Complex Permittivity by Free
Space Methods and Their Application. NY: Elseiver, 1986, 276 p.
9. Brekhovskikh L.М. Volny v sloistykh sredakh, 2d izd. М.: Nauka, 1973, 343 p.
10. Roberts S., von Hippel A.J. Appl. Phys., 1948, vol. 17, 610 p.
11. Nicolson A.M., Ross G.F. IEEE Trans. Instr. Meas, 1970, vol. 19, 377 p.
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